Proton Induced X-ray Emission Studies Using Folded tandem Ion Accelerator (FOTIA) at Bhabha Atomic Research Centre (BARC), Trombay, Mumbai, India
Keywords:FOTIA, PIXE, Gemstones, Pottery Samples
The Folded Tandem Ion Accelerator (FOTIA) at Van De Graaff was used to study PIXE (Particle-induced X-ray Emission) using protons of energy 3-5 MeV. It has been used for a variety of applications from studying intensity ratios, biological samples (blood), rare earth, materials (gold standards), geological samples (gemstones) pottery samples and forensic samples (ink). This article attempts to elucidate the preparation methods of the samples, the detectors used, the analysis and the findings therein for different applications.
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 K.B. Dasari, R. Acharya, Daisy Joseph and N. Lakshmana Das, Application of INAA and PIXE for analysis of archaeological pottery samples, 2011-Proceedings of the DAE Symp. on Nucl. Phys., 56, 1150, 2011.
 D. Joseph, Characterization a few Gemstones by X-ray Emission Techniques (EDXRF and EXTERNAL PIXE), International Journal of PIXE, 21, 22, 2010.