Proton Induced X-ray Emission Studies Using Folded tandem Ion Accelerator (FOTIA) at Bhabha Atomic Research Centre (BARC), Trombay, Mumbai, India

  • Daisy Joseph Nuclear Physics Division, Bhabha Atomic Research Centre, Trombay, Mumbai, India
Keywords: FOTIA, PIXE, Gemstones, Pottery Samples

Abstract

The Folded Tandem Ion Accelerator (FOTIA) at Van De Graaff was used to study PIXE (Particle-induced X-ray Emission) using protons of energy 3-5 MeV. It has been used for a variety of applications from studying intensity ratios, biological samples (blood), rare earth, materials (gold standards), geological samples (gemstones) pottery samples and forensic samples (ink). This article attempts to elucidate the preparation methods of the samples, the detectors used, the analysis and the findings therein for different applications.

References

[1] D. Joseph, Proton Induced X-ray Emission (PIXE) technique: some applications in Bio-Sciences, Indian Journal of Radiation Research, 2, 2, 2005.
[2] D. Joseph, A. Saxena and S. Kailas, PIXE studies using the Van de Graff accelerator at BARC, Trombay- Differences in elemental concentrations in blood samples of children, International Journal of PIXE, 15, 1&2, 2005.
[3] D. Joseph and A. Saxena, Setting up of a PIXE facility at FOTIA at BARC,2005, Indian Journal of Physics, 79, 2, 143-146, 2005.
[4] D. Joseph, A.Saxena, S.K.Gupta and S.Kailas, PIXE studies on gold standards by protons of energy 3.3 MeV, 2, International Journal of PIXE, 14, 3 & 4, 141, 2004.
[5] D. Joseph, S. D. Maind, A. Saxena and R. K. Choudhury, Characterization of tagged printing ink tagged by rare Earths by X-ray emission techniques.(EDXRF and PIXE),2007, International Journal of PIXE, 17, 3 & 4, 183−191, 2007.
[6] K.B. Dasari, R. Acharya, Daisy Joseph and N. Lakshmana Das, Application of INAA and PIXE for analysis of archaeological pottery samples, 2011-Proceedings of the DAE Symp. on Nucl. Phys., 56, 1150, 2011.
[7] D. Joseph, Characterization a few Gemstones by X-ray Emission Techniques (EDXRF and EXTERNAL PIXE), International Journal of PIXE, 21, 22, 2010.
Published
2019-01-01
Section
Research Articles