Abstract
A simple method, proposed by us earlier, - 2π geometrical configuration coupled with the thickness criterion - to measure the Kshell X-ray fluorescence parameters is extended to high Z material- Thorium. The fluorescent X-rays are generated by a weak Co-57 radioactive source and detected by employing a NaI (Tl) detector spectrometer. Measured value is compared with the best fitted value produced by Hubbell et al. and with the experimental value of Balakrishna et al. We found good agreement with each other, thus establishing the applicability of our simple method for measuring fluorescence yield of high Z element.
